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Hark Hoe Tan: Introduction to Material Characterization Techniques--Electron beam, ion beam, X-ray and optical techniques

时间:2019-11-25来源:

:Hark Hoe Tan 教授

工作单位:澳大利亚国立大学

举办单位:材料科学与工程学院,先进功能材料与器件安徽省重点实验室

报告人简介

Prof. Tan has been the past recipient of the Australian Research Council Postdoctoral, QEII and Future Fellowships. He has published/co-published over 400 journal papers and 6 book chapters with a total of over 12000 citations and a h-index of 54. He is also a co-inventor in 4 US patents related to laser diodes and infrared photodetectors. His research interests include epitaxial growth of low-dimensional compound semiconductors, nanostructured optoelectronic devices and ion-implantation processing of compound semiconductors for optoelectronic device applications. Prof. Tan is a Senior Member of the IEEE and was the Distinguished Lecturer for IEEE Nanotechnology Council (2016 & 2017) and IEEE Photonics Society (2016-2017).

学术报告信息(一)

报告题目:Introduction to Material Characterization Techniques: Eelectron beam

报告时间:2019年11月26日(星期二)10:30

报告地点:材料楼301会议室

学术报告信息(二)

报告题目:Introduction to Material Characterization Techniques: Ion beam

报告时间:2019年11月28日(星期四)16:00

报告地点:材料楼301会议室

学术报告信息(三)

报告题目:Introduction to Material Characterization Techniques: X-ray and optical techniques

报告时间:2019年11月29日(星期五)16:00

报告地点:材料楼301会议室

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